The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2001

Filed:

Sep. 17, 1999
Applicant:
Inventors:

Shinichi Ozaki, Tokyo, JP;

Katsushi Abe, Tokyo, JP;

Nobuhiro Takahashi, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/435 ;
U.S. Cl.
CPC ...
B41J 2/435 ;
Abstract

At least two light beam detection units are spaced at a predetermined distance and provided in the scanning direction of a surface to be scanned. A light beam is emitted to the light beam detection unit provided on a scanning start side, by lighting a light beam source which is employed to scan the surface linearly during a scanning period equivalent to 1 dot during scanning. A light beam is emitted to the light beam detection unit provided on a scanning end side, by lighting the light beam source during the scanning period after elapse of a light-off period computed from a previously designed scanning speed and the predetermined distance. Based on a detection result of the light beam detection unit provided on the scanning start side and a detection result of the light beam detection unit provided on the scanning end side, scanning characteristics required of the light beam are evaluated.


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