The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2001
Filed:
Oct. 22, 1998
Applicant:
Inventors:
Rina K. Dukor, Elmhurst, IL (US);
Curtis A. Marcott, Cincinnati, OH (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ; G01N 2/135 ;
U.S. Cl.
CPC ...
G01B 9/02 ; G01N 2/135 ;
Abstract
A method and system performs Fourier transform infrared (FT-IR) imaging microspectroscopy on a biological sample fixed on a substrate with a supporting surface that generally reflects infrared light while generally transmitting visible light. Infrared light impinging on the biological sample is reflected by the supporting surface of the substrate. Infrared light from the sample is focused onto a focal-plane array detector with multiple pixels for detecting infrared images of the sample. The detected infrared images are processed to generate spectral images of the sample. The same biological sample is suitable for conventional pathological studies.