The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2001
Filed:
Aug. 31, 1998
Applicant:
Inventors:
Brian Chen, Somerville, MA (US);
Carl-Erik Wilhelm Sundberg, Chatham, NJ (US);
Assignee:
Agere Systems Guardian Corp., Miami Lakes, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/303 ;
U.S. Cl.
CPC ...
H03M 1/303 ;
Abstract
The likelihood of significant errors in a decoded sequence is determined based on at least one criterion that is both extrinsic and intrinsic to the decoded sequence. In particular, this determination is preferably made by comparing a signal corresponding to the decoded sequence with a so-called error mitigation signal.
Chen, Brian. (2001). Screening for errors in data transmission systems (U.S. Patent No. 6272660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6272660
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile