The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2001
Filed:
Oct. 14, 1998
Masayuki Yoshiyama, Chiba, JP;
Kawasaki Steel Corporation, Kobe, JP;
Abstract
A semiconductor integrated circuit and method of use improve a rate of defect detection and also facilitate production of test patterns while suppressing an increase of the circuit area. The semiconductor integrated circuit includes a plurality of pairs of a sequence circuit and selector circuit. Each of the sequence circuits stores an operation result of an internal circuit, whereas each selector circuit is responsive to a control signal for selecting one of the data stored in its associated sequence circuit and an inverted version of the data to thereby output the selected data. A control circuit operates to count up or divide clocks and then control the selector circuits constituting the plurality of pairs in accordance with the resultant count values.