The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

May. 01, 1998
Applicant:
Inventors:

Allen G Hirsh, Silver Spring, MD (US);

Latchezar I. Tsonev, Gaithersburg, MD (US);

Serguei Litvinovitch, Gaithersburg, MD (US);

Patrick M. Mehl, North Potomac, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01W 3/100 ; B01F 1/900 ;
U.S. Cl.
CPC ...
G01W 3/100 ; B01F 1/900 ;
Abstract

The present invention provides a new analysis based on Differential Spectral Topographic Analysis (DISTA). Using data from the spectral methods known in the art, DISTA is based upon the normalization of the spectra to a fixed topographic space, creating a set of spectral forms, and the summation of the absolute differences in topography between one or more reference spectra and the test spectra taken at different magnitudes of the perturbing parameter. This method allows for a sensitive estimate of the fraction of form A and form B of an entity of interest. This method also allows for the calculation of apparent free energy from the conversion of the entity of interest from a first to a second form where appropriate, and in the alternative, calculation of a fraction of structural changes.


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