The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

May. 10, 1999
Applicant:
Inventors:

Rongsheng Li, Hacienda Heights, CA (US);

Yeong-Wei A. Wu, Rancho Palos Verdes, CA (US);

Douglas H. Hein, Los Angeles, CA (US);

Garry Didinsky, Niles, IL (US);

Assignee:

Hughes Electronics Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 2/102 ; B64G 1/36 ;
U.S. Cl.
CPC ...
G01C 2/102 ; B64G 1/36 ;
Abstract

A system and method of estimating the attitude of a spacecraft compares a three-axis inertial-based estimate of spacecraft attitude to a stellar-based estimate of the spacecraft attitude. A Kalman filter having some states associated with low spatial frequency errors compares the stellar-based attitude estimate to the inertial-based estimate of attitude and apportions total attitude error into two time varying matrices. A first time varying matrix is associated with star tracker low spatial frequency errors, a second time varying matrix is associated with gyro bias errors and attitude errors. The time varying matrices are used to apply corrective feedbacks to the stellar-based attitude estimate and the inertial-based estimate of spacecraft attitude, and are adaptively adjusted to minimize total estimated attitude error.


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