The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2001
Filed:
Jan. 20, 1999
Shijun Sun, Seattle, WA (US);
Yongmin Kim, Seattle, WA (US);
University of Washington, Seattle, WA (US);
Abstract
Pixel data forming an image is clustered into groups of data of similar color. Pixels of approximately the same color form one cluster. A vigilance parameter determines how many clusters are derived and how wide a range of colors are included in a cluster. The process for allocating input vectors into clusters is based upon a minimum distance measure to multiple prototype vectors. A given image frame is allocated into clusters in an iterative process. A subset of clusters from an initial image frame are treated as featured clusters. The featured clusters correspond object(s). To track the object, input vectors in subsequent frames are tested to determine whether they correspond to a featured cluster. A scene change is detected when more than a prescribed number of prototype vectors have changed by more than a predetermined amount.