The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

Aug. 05, 1998
Applicant:
Inventors:

Yasuko Takahashi, Tokyo, JP;

Akio Shio, Tokyo, JP;

Sakuichi Ohtsuka, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/66 ;
U.S. Cl.
CPC ...
G06K 9/66 ;
Abstract

A method for extracting a pre-selected pattern from an image by a programmed computer is able to identify and extract the pattern even under adverse conditions such as presence of noise or shadow in the image or the target pattern is partially shielded. The steps are: storing reference patterns for referencing; storing input images; applying filtering processes to reference patterns and input images; integrating filtered results of the reference pattern and filtered results of the input image to generate integrated results; and extracting a reference pattern according to the integrated results and specifying a location of the reference pattern in the input image. An image abnormality detection can also be performed using the basic method to identify a normal scene and detect a deviation from normalcy even under adverse conditions.


Find Patent Forward Citations

Loading…