The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

Mar. 27, 1999
Applicant:
Inventors:

Masaji Furuta, Hyogo, JP;

Koichi Yanagawa, Hyogo, JP;

Assignee:

Agilent Technologies, Inc., Loveland, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/04 ;
U.S. Cl.
CPC ...
G01R 1/04 ;
Abstract

A probe for measuring signals with a narrow contact pitch comprises an end section having a main tip member and a sub-tip member, each of which passes through one of two holes in a housing. The sub-tip member is electrically connected to the housing and the main-tip member is insulated from the housing by an insulation member. The sub-tip member is pivotally connected to the housing. The subtip member is asymmetric with respect to the pivot and therefore, its sharpened end can trace a circular orbit when the sub-tip member turns on its pivot. The distance between the two end sections of these tip members (that is, the contact pitch) can be set to a desired length by positioning sub-tip sharpened end section to any point on this orbit.


Find Patent Forward Citations

Furuta, Masaji. (2001). Probe for measuring signals (U.S. Patent No. 6271673). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6271673

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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