The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2001
Filed:
Dec. 22, 1998
Applicant:
Inventors:
Alexander R. Mitwalsky, Poughkeepsie, NY (US);
Tze-Chiang Chen, Yorktown Heights, NY (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/9544 ; H01L 2/906 ; H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/9544 ; H01L 2/906 ; H01L 2/144 ;
Abstract
Crack stops for substantially preventing cracks and chips produced along the dicing channel from spreading into the active areas of the ICs are described. The crack stops are formed by creating discontinuities in the thickness of the dielectric layer in the dicing channel near the chip edges. The discontinuities can result in increasing and/or decreasing the thickness of the dielectric layer.
Mitwalsky, Alexander. (2001). Crack stops (U.S. Patent No. 6271578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6271578
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile