The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

Jun. 24, 1998
Applicant:
Inventors:

Charles W. Hewitt, Marlton, NJ (US);

Rajen Ramsamooj, Sacramento, CA (US);

Edward John Doolin, Westmount, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/348 ;
U.S. Cl.
CPC ...
G01N 3/348 ;
Abstract

Cytopathology specimens such as cervical Pap smears, are evaluated using oblique illumination of the specimens (preferably by multiple beams) rather than the axial illumination of standard compound microscopes. The result is improved visualization of the specimens, increased light penetration through the specimens, increased depth of field and enhanced contrast and resolution.


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