The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

May. 26, 1999
Applicant:
Inventors:

Elisa Konofagou, Houston, TX (US);

Jonathan Ophir, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

The present invention is directed toward a new method that combines interpolation between neighboring A-lines with cross-correlation for high precision estimation of the transverse displacement. Due to this high precision lateral estimation, the method of the present invention can produce quality lateral-elastograms that display the lateral component of the strain tensor. These higher precision lateral displacement estimates also allow a finer correction for the lateral decorrelation that corrupts the axial estimation. The method of the present invention may be employed to divide the lateral-elastogram by the axial-elastogram on a pixel-by-pixel basis, in order to produce a new image that displays the distribution of Poisson's ratios in the tissue.


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Konofagou, Elisa. (2001). Method for estimating and imaging of transverse displacements, transverse strains and strain ratios (U.S. Patent No. 6270459). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6270459

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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