The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2001

Filed:

Jan. 10, 2000
Applicant:
Inventors:

Heui Jae Pahk, Seoul, KP;

Young Sam Kim, Seoul, KP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 2/500 ;
U.S. Cl.
CPC ...
G01C 2/500 ;
Abstract

An apparatus for measuring three-dimensional volumetric errors in a multiaxis machine tool is disclosed. The apparatus comprises a kinematic ball bar provided with two balls at both ends thereof as a basic construction. A U-shaped bar with two extension arms is integrated with the ball bar. A vertical post is positioned relative to the U-shaped bar and is integrated with one of the two balls. A sleeve is fitted over the post and two guide bars is fixedly and longitudinally assembled with an external surface of the sleeve at opposite positions. Each of the guide bars is provided with a slot at a lower portion thereof for movably receiving an operating pin.


Find Patent Forward Citations

Loading…