The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2001

Filed:

Oct. 10, 1997
Applicant:
Inventors:

Ho-Shang Lee, El Sobrante, CA (US);

Ming-Ching Lo, El Sobrante, CA (US);

Brian Chiang, Berkeley, CA (US);

Assignee:

Dicon Fiberoptics, Inc., Berkeley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/28 ;
U.S. Cl.
CPC ...
G02B 6/28 ;
Abstract

The optical thickness of an optical device such as an interference filter or optical isolator is altered by applying stress thereto. This changes the frequency or isolation characteristics of the filter or isolator. The two sides of the device may be clamped to a member having a temperature expansion coefficient which is different from that of the device in order to apply tension or compression to the device in response to temperature changes. In this manner, the shifts in optical characteristics of the device due to temperature change is at least partially cancelled by the shifts in optical characteristics induced by stress applied by the member.


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