The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2001
Filed:
Mar. 11, 1999
Albert H. Ohlig, Newport Beach, CA (US);
OLEC Corporation, Irvine, CA (US);
Abstract
Method and apparatus operates on recognizable target images disposed on upper and lower layers of master photographic images, and on apertures formed in an intermediate layer to resolve positional misalignments and requisite correctional movements of the layers to align upper and lower layers with the intermediate layer within tolerances that are improved by multiple samples of position data pertaining to the apertures formed in the intermediate layer. Inspection cameras produce output data signals representative of target images and aperture patterns detected by inspection cameras that are positioned to establish fields of view encompassing aperture patterns on an intermediate layer and distinguishable target images on upper and lower layers. A computer responsive to the output data signals from the inspection cameras segregate the recognizable target images and aperture patterns and produce output control signals to mechanical translators coupled to the intermediate panel and to one of the upper and lower layers for selectively positioning the movable layers along orthogonal and skew axes to align the positions of the three layers with improved accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile