The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2001
Filed:
Aug. 20, 1998
Miha Fuderer, Eindhoven, NL;
Cornelis L. G. Ham, Eindhoven, NL;
Joost M. De Haan, Eindhoven, NL;
Johannes H. Den Boef, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
The invention relates to a method and a device for the imaging of a part of an object which is arranged in a steady magnetic field. The method according to the invention includes a step for filtering the shot noise from the measured MR signals. Filtering is performed by determining in a first step the value of a combination of a value of a parameter of a measuring point of the MR signal to be corrected and values of the parameter of measuring points in a vicinity of the measuring point. If the value of this combination exceeds a predetermined reference, the value zero is assigned to the value to be corrected. The invention is based on the idea that for a substantial part of the k space the corresponding MR signals behave as white noise. The reference is determined from the statistical distribution of the white noise. If the value of the combination exceeds the reference, it is assumed that a measuring point has been affected by shot noise.