The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2001

Filed:

Nov. 22, 1999
Applicant:
Inventors:

John William Shultz, Verona, WI (US);

Martin K. Lewis, Madison, WI (US);

Michelle Mandrekar, Oregon, WI (US);

Donna Leippe, Middleton, WI (US);

Roderick R. Smith, Jr., Fitchburg, WI (US);

Roy Welch, Palo Alto, CA (US);

Assignee:

Promega Corporation, Madison, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; G01N 2/400 ; C07H 1/904 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; G01N 2/400 ; C07H 1/904 ;
Abstract

Mass spectrometric, absorbance spectroscopic and fluorescence spectroscopic processes are disclosed to detect the depolymerization of a nucleic acid hybrid in order to qualitatively and quantitatively assay for the presence of a predetermined nucleic acid target. Applications of those processes include the detection of single nucleotide polymorphisms, identification of single base changes, speciation, determination of viral load, genotyping, medical marker diagnostics, and the like, including multiplexed assays.


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