The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2001

Filed:

Feb. 22, 1999
Applicant:
Inventors:

John F. Dwinell, Wrentham, MA (US);

Richard Lydon, Hanover, MA (US);

Assignee:

CiMatrix, Canton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

A bar code scanning system and method for scanning a bar code containing a key including successively scanning the bar code and providing, for each scan, a plurality of data elements forming a scan fragment for at least a portion of the bar code, identifying each fragment containing a portion of a reference key, detecting when there has been a match between a reference key and the identified key fragments, determining if a complete key has been constructed from the key fragments, calculating a displacement between the key fragments which constructed the complete key, and aligning data fragments of the bar code by placing each successive data fragment in alignment with the previous data fragment offset by the amount of the displacement.


Find Patent Forward Citations

Dwinell, John. (2001). Bar code scanning system and method (U.S. Patent No. 6267293). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6267293

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…