The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2001
Filed:
Mar. 31, 1999
Applicant:
Inventors:
Steven Michael Kurtz, Haddonfield, NJ (US);
Charles William Jewett, San Jose, CA (US);
Jude Reynold Foulds, Los Altos, CA (US);
Assignee:
Exponent, Inc., Menlo Park, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/16 ; G01D 7/02 ;
U.S. Cl.
CPC ...
G01D 1/16 ; G01D 7/02 ;
Abstract
A small punch test apparatus is used to determine true stress and true strain in a ductile polymeric material as it undergoes deformation by the punch head. The information gathered can be used comparatively to assess the acceptability of a body implant subjected to sterilization against similar information obtained on another implant of the same polymer already known to be acceptable.