The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2001

Filed:

Nov. 15, 1999
Applicant:
Inventor:

Michael Hackenberg, Lübeck, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/50 ; G01N 2/178 ;
U.S. Cl.
CPC ...
G01J 1/50 ; G01N 2/178 ;
Abstract

A system for measuring the concentration of gases using gas-selective indicator substances in a chip-like carrier (,) with an optoelectronic scanning device (,). The chip-like carrier (,) has composite partial elements (,) wherein one partial element (,) contains channels (,) for guiding the gas in the carrier (,), and another partial element (,) has at least one multireflection element (,) for guiding light. Each multireflection element (,) is provided with a layer (,) with indicator substances, which layer faces the gases to be measured and reacts with same in a gas-selective manner. The optoelectronic scanning device (,) has at least one radiation source (,) with an associated radiation detector (,), which are in optical functional connection with each multireflection element (,).


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