The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2001
Filed:
Sep. 16, 1999
Carlo Albertini, Ispra, IT;
Mikhail Mogilevsky, Novosibirsk, RU;
European Atomic Energy Community, Luxembourg, US;
Abstract
Stress wave measuring apparatus includes a Hopkinson bar or pressure bar bundle system comprising an input bar bundle having input bars, and an output bar bundle having output bars,. A brittle test specimen is positioned in between the input and output bar bundles. Means is provided to induce a one dimensional compression force into the bar bundles. Instrumentation is introduced onto the input and output bars for measuring values of shear wave or crack propagation. The specimen may be placed under different stress conditions measured by appropriate instrumentation on the bar bundles. In one embodiment, a rod gauge is glued to a rock massive and arranged to measure wave effects generated in the rock massive. Other arrangements provide amplification of the wave effects prior to measurement by instrumentation on the gauge