The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2001

Filed:

Sep. 03, 1998
Applicant:
Inventors:

Gustavo Deco, München, DE;

Bernd Schürmann, Haimhausen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ;
U.S. Cl.
CPC ...
G06F 1/700 ;
Abstract

A method for determining conditioned entropies for a prescribable plurality of future sampling times for a set of samples based upon an information flow. A classification of a time series is implemented on the basis of the information flow. The information flow reflects nonlinear correlations between the samples. A classification is thus possible between those time series whose samples are non-linearly correlated and those time series whose samples are stochastically independant.


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