The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2001
Filed:
Mar. 18, 1999
Applicant:
Inventor:
Morgan S. McGuire, Waltham, MA (US);
Assignee:
NEC Research Institute, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 ;
U.S. Cl.
CPC ...
G06K 9/32 ;
Abstract
A method for registering a pattern image with a reference image is provided. The pattern image and the reference image differ from each other by a Rotation-Scale-Translation (RST) transformation defined by a scale factor s, a rotation factor &phgr;, and a translation vector (&Dgr;x, &Dgr;y). A Fourier-Mellin invariant is used to perform image registration by isolating the rotation, scale and transformation parameters of the RST transformation between the reference image r and the pattern image p.