The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2001
Filed:
Apr. 09, 1999
Thomas Arthur Bett, Oshkosh, WI (US);
Tanakon Ungpiyakul, Neenah, WI (US);
Shawn Timothy Lemery, South Ogden, UT (US);
Robert Jeffrey Giza, Appleton, WI (US);
Wayne Allen Bernhardt, Oshkosh, WI (US);
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
Controlling processes comprising detecting and measuring a parameter, for example presence and location of an element of a good, with at least two determinations as representations of the target parameter, transmitting signals to the computer, and processing the signals to compare the parameter to acceptable conditions. The detection can include three or more replications, optionally each for at least two parameters, optionally using at least two different methods to analyze the signals. The invention contemplates detecting and analyzing the target parameters using two or more analytical tools within the respective image to detect a given component of the product, namely two or more measurements of the parameter on a single visual image. Analytical methods can include averaging the signals, determining the number of signals of common signal duration and/or signal characteristics, computing standard deviation, modifying the signal combination to compensate for an inappropriate signal, and/or comparing the signals to a database of signal combinations. The method can automatically compute probable cause of some anomalies in the signals, develop corresponding responses, and transmit responses to process control, and thence to control devices. The methods can automatically recalibrate determinors, or automatically adjust analysis to a basis of one less determinor, and/or automatically implement back-up inspection of goods, optionally saving images for further analysis, or culling units of product. Digitized visual images represent pixels and pixel combinations. The method contemplates analyzing the pixel representations with at least two determinations of the parameter in respective at least two areas of the image, optionally for at least two parameters at respective replication sites, using software interpretation of selected areas of the visual image.