The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2001
Filed:
May. 17, 1999
Applicant:
Inventors:
Johann Engelhardt, Bad Schonborn, DE;
Thomas Zapf, Speyer, DE;
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract
The invention relates to a method for measuring surfaces by confocal microscopy using the reflection method, specially to measure the superficial profiles (,) of treated or drilled teeth (,). The invention seeks to eliminate mistakes occurring when very inclined areas are measured. To this end, the method disclosed is characterized by a confocal representation with enhanced dynamics (relative sensitivity) enabling it to project both the retro-reflections and the weak scattered light (,) or fluorescent light of each focal plane (,).