The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2001
Filed:
Nov. 16, 1999
Hak Kyu Lee, Daejon-Shi, KR;
Dong Sung Lim, Daejon-Shi, KR;
Min Yong Jeon, Daejon-Shi, KR;
Joon Tae Ahn, Daejon-Shi, KR;
Kyong Hon Kim, Daejon-Shi, KR;
Electronics and Telecommunications Research Institute, Daejon-Shi, KR;
Abstract
An apparatus for measurement of an optical pulse shape intended to measure the temporal waveform of an ultrashort single optical pulse is disclosed. The present invention comprises a linearly chirped supercontinuum light source that is synchronized with an optical pulse to be measured; a nonlinear optical interferometer to transform the temporal waveform of an incident optical pulse into a spectrum using an incident light from said supercontinuum light source; and an optical spectrum analyzer to measure the wavelength of the light passing through the nonlinear interferometer so that it can measure the temporal waveform of a single optical pulse. The present invention employs the method that transforms the temporal waveform of an incident optical pulse into a spectrum and measures the wavelength using a linearly chirped supercontinuum light source, a nonlinear optical interferometer, and an optical spectrum analyzer. The present invention provides an apparatus for measurement of an optical pulse shape that is able to measure the waveform not with the repeated measurements but with a single shot measurement.