The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2001

Filed:

Oct. 28, 1999
Applicant:
Inventor:

Joseph Wu, Hsinchu Hsien, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/00 ; G06K 9/00 ; G06K 7/10 ;
U.S. Cl.
CPC ...
B07C 5/00 ; G06K 9/00 ; G06K 7/10 ;
Abstract

A wafer ID optical sorting system includes an auto-ID reader, a manual-ID reader and a conveying device, operation of which units is controlled by a monitoring system. The auto-ID reader, connected to the monitoring system, can automatically read and identify an ID and allows the ID to be displayed on the monitoring system. The manual-ID reader, connected to the monitoring system, can fetch the ID image and allows it to be displayed on the monitoring system. The conveying device, connected to the monitoring system, can move the auto-ID reader and the manual-ID reader.


Find Patent Forward Citations

Wu, Joseph. (2001). Wafer id optical sorting system (U.S. Patent No. 6265684). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6265684

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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