The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2001

Filed:

Sep. 10, 1998
Applicant:
Inventors:

Zahi Zloter, Holon, IL;

Gideon Shenholz, Tel Aviv, IL;

Ron Serber, Tel Aviv, IL;

Assignee:

Electronics for Imaging, Inc., Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08C 2/100 ;
U.S. Cl.
CPC ...
G08C 2/100 ;
Abstract

A method and corresponding system for tracking variations in distance D calculated from time-of-flight measurements of a sequence of pulses of a pressure wave oscillation from a transmitter to a receiver identifies a state of synchronous operation by obtaining at least two time-of-flight measurements derived from successive pressure wave pulse which satisfy given synchronicity criteria. Successive time-of-flight measurements are then monitored to identify a shifted time-of-flight measurement which varies by at least half of the wave period from a predicted time-of-flight value calculated from a number of preceding time-of-flight measurements. A shift factor is then identified corresponding to an integer multiple of the wave period by which the shifted time-of-flight measurement must be corrected to obtain a corrected time-of-flight measurement falling within half of the wave period from the predicted time-of-flight value. The distance D calculated from the shifted time-of-flight measurement is then corrected by the product of the shift factor and the pressure wave wavelength.


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