The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2001
Filed:
Oct. 21, 1999
Applicant:
Inventors:
David R. Williams, Fairport, NY (US);
Geun-Young Yoon, Rochester, NY (US);
Assignee:
University of Rochester, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract
Wavefront aberrations in an eye are detected by illuminating the retina, receiving the light reflected by the retina and using a Hartmann-Shack detector or the like to detect the aberrations. The illuminating light is applied to the eye off of the optical axis of the eye. Light reflected from the cornea and light reflected from the retina travel in different directions. The former can be blocked with a stop, while the latter is passed to the detector.