The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2001

Filed:

Apr. 22, 1999
Applicant:
Inventors:

Gilles Iafrate, Chaponost, FR;

Jean-Pascal Mallet, Saint Priest en Jarez, FR;

Roland Petit, Saint Etienne, FR;

Assignee:

Schlumberger Systemes, Montrouge, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract

Conformance testing apparatus for testing the consumption of an electronic component in a testing machine. The apparatus includes a power supply circuit having current-measuring circuitry for measuring the current taken, a test sequencer, and a measurement sequencer in which each row contains a measurement flag representative of a command to perform or not to perform a current measurement. The measurement sequencer includes a multiple acquisition memory in which each acquisition row corresponds to a row of the measurement sequence whose measurement flag is positive. The memory includes, for each acquisition row, at least one limit value zone in which a limit value for the current is written, and at least one conformance zone in which a conformance flag is written representative of the result of a comparison between the current as measured and the limit value.


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