The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2001

Filed:

Jul. 24, 1998
Applicant:
Inventors:

Akiro Hatano, Fujisawa, JP;

Naoyuki Kagami, Fujisawa, JP;

Nobuya Matsubara, Fujisawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 2/900 ;
U.S. Cl.
CPC ...
G11C 2/900 ;
Abstract

The present invention relates to a testing method and tester which reliably flags errors in disk drives, thereby reducing disk failures. In the testing method and tester, a random error due to noise occurs anywhere in a sector (read)/cylinder (write), whereas a repeatable error occurs in a specific area on a disk. If a plurality of random errors occur in the same sector or cylinder, no flagging is performed if the occurrence positions are distant from each other.


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