The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2001
Filed:
Sep. 23, 1998
Steven J. Simske, Greeley, CO (US);
Jeffrey P. Lee, Greeley, CO (US);
Hewlett Packard Company, Palo Alto, CA (US);
Abstract
Scanned region type sensitivity logic and scanned region clustering/declustering logic allow the manipulation of regions within a scanned image. A scanned region type sensitivity logic allows the manipulation of region type attributes by allowing a user of a scanner product, through the use of a user interface, to adjust the sensitivity of a particular region type in real time, with the results of the adjustment displayed back to the user through the user interface. A scanned region clustering/declustering logic allows a user of a scanner product, through the use of a user interface, to manipulate the grouping of regions displayed to the user in real time. Both of these forms of scanning logic are predicated on the underlying use of a document analysis technology that stores probabilities (“p-values”) or other relative statistics on all plausible region types as part of the definition of the regions.