The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2001
Filed:
Sep. 22, 1999
Takashi Nagano, Tokyo, JP;
Atsuhiro Tsuchiya, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A fluorescent microscope to observe a specimen dyed with a plurality of fluorescent dyes comprises a first filter which selectively transmitting light from a light source, a dichroic mirror which leads an light transmitting the first filter to the specimen and transmits fluorescence from the specimen, a second filter which selectively transmitting fluorescence from the specimen, a changing section to change at least one transmitting wavelength bands of the first filter and the second filter, a detection section to detect the wavelength selected by the changing section, an imaging element which images an image of the specimen, and an identification section to identify a kind and the position of the fluorescent dyes with which the specimen is dyed based on a wavelength data obtained from the detection section before and after a change in the transmitting wavelength band by the wavelength change section and a change in the image according to a change in the transmitting wavelength band.