The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2001
Filed:
May. 13, 1998
Jasvinder Obhi, Nepean, CA;
Paul Colbourne, Nepean, CA;
JDS Fitel Inc., Nepean, CA;
Abstract
The present invention relates to a circuit for monitoring optical signals in a multiple channel system. A tunable band pass filter receives and input signal comprising multiple channels each having a different wavelength and predetermined channel spacing. Output from the tunable filter is directed to a second filter having a periodic response with wavelength, such as an etalon. The response is designed to block wavelengths of light corresponding to the channels, permitting noise in the inter-channel space to be measured by a detector. A reference circuit launches light from a broad band source through a Bragg grating into the tunable filter. The Bragg grating reflects a known reference wavelength. Light which passes from the reference source through the tunable filter is also passed through the second filter to a detector. When a notch is detected by the reference detector, the tunable filter is known to be tuned to the reference wavelength. A comparison to the signal output at the first detector is used to correlate the position of the notch and the location of any inter-channel noise. A third filter, also preferably a fixed etalon, has a periodic response which matches the channel spacing designed to block wavelengths of light corresponding to the inter-channel spaces. A third detector measures the channel amplitude and also correlates the response with the reference notch to identify the individual channels. Advantageously, the monitoring circuit can provide channel and noise information associated with each channel without using costly and complex elements to identify the wavelength of the responses.