The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2001

Filed:

Jan. 17, 1997
Applicant:
Inventor:

Takao Furukawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract

There is provided a microfilm scanner which easily eliminate a search mark provided to each frame of a strip-shaped microfilm to precisely read only a range (image photographed range) including the frame. The microfilm scanner comprising: a film-edge detector for a width edge of the microfilm in each main scanning line in response to an output of a line sensor; and reading-range setter for setting an image reading range in each main scanning line by referring the detected edge of the microfilm. In a case that a width of the film is known in advance, start and end points of the image reading range may be determined from the first edge detected along a main scanning direction of the film-edge detector. A control method for the microfilm scanner is also provided.


Find Patent Forward Citations

Furukawa, Takao. (2001). Microfilm scanner and control method therefor (U.S. Patent No. 6262814). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6262814

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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