The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2001

Filed:

Aug. 28, 1998
Applicant:
Inventors:

Daniel C. Baker, Milpitas, CA (US);

Kouros Ghandehari, San Jose, CA (US);

Satyendra S. Sethi, Pleasanton, CA (US);

Assignee:

Philip Semiconductors, Inc., Tarrytown, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 2/742 ; G03B 2/728 ; G01N 2/186 ; G03F 9/00 ;
U.S. Cl.
CPC ...
G03B 2/742 ; G03B 2/728 ; G01N 2/186 ; G03F 9/00 ;
Abstract

An apparatus for forming a pattern in a photoresist material includes a light source to provide light for illuminating a portion of the photoresist material according to the pattern and a filter positioned in a path of the light. The filter includes a number of regions upon which a filtering material has been. The filtering material has a variable characteristic that is independently adjustable for each region to enhance the uniformity of the intensity of the light. Such characteristics include the thickness of the filtering material, the size of the portion of the region that is covered by the filtering material, or a voltage, current, electric field, or magnetic field applied to the filtering material of each region.


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