The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2001
Filed:
Oct. 26, 1998
Applicant:
Inventors:
Sami Kiriaki, Garland, TX (US);
Mark A. Wolfe, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 ;
U.S. Cl.
CPC ...
H03M 1/00 ;
Abstract
The invention comprises a differential sample-and-hold circuit including a differential gain stage. The differential gain stage comprises a control transistor and an output node. The differential gain stage further comprises a primary load coupled between the control transistor and the output node. A hold control circuit is coupled to the base of the control transistor, the hold control circuit operable to effect a reduction of the base voltage of the control transistor and a corresponding reduction of the voltage at the output node of the differential gain stage.