The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2001

Filed:

Sep. 17, 1999
Applicant:
Inventors:

Taketoshi Nakao, Kyoto, JP;

Masaya Ugaji, Osaka, JP;

Kenichi Takeyama, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 1/046 ;
U.S. Cl.
CPC ...
H01M 1/046 ;
Abstract

A method of measuring quantities that indicates the state of an electrochemical device having an electrode and an ionic conductor, such as material properties or a residual capacity, without disassembling the device. The quantities are measured by comparing (a) a series of theoretical data of an electrical characteristic of the device obtained by combining at least one of an electron transportation model of the electrode, an ion transportation model of the electrode, an ion conduction model of the ionic conductor and a model of an electrochemical reaction taking place in an interface between the electrode and the ionic conductor, with a potential model of the electrode, with (b) a series of measured data of the electrical characteristic of the electrochemical device.


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