The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2001

Filed:

Apr. 07, 1998
Applicant:
Inventors:

Tomonori Mimura, Tomobe-machi, JP;

Ryuichiro Kodama, Hitachinaka, JP;

Atsushi Takahashi, Mito, JP;

Hiroshi Mitsumaki, Mito, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/502 ;
U.S. Cl.
CPC ...
G01N 3/502 ;
Abstract

A system setup for a sample analysis system having a plurality of analysis units placed along a main conveyor line prior to its analysis operation. The system setup includes setup of analysis units in combination with different types of reagent supply units, setup of analysis routes as to whether it is a stationary type or an automatic type, and setup of analysis items for each analysis unit as to which analysis item should be assigned to which analysis unit having which reagent supply type. These settings are executed through monitoring of setup screens displayed on a screen display unit, and the contents of such a setting are stored and registered in a memory of the controller.


Find Patent Forward Citations

Loading…