The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2001

Filed:

Nov. 12, 1998
Applicant:
Inventors:

Neena Annie Cherian, San Jose, CA (US);

Bruce McNutt, Gilroy, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/200 ; G06F 1/134 ;
U.S. Cl.
CPC ...
G06F 1/200 ; G06F 1/134 ;
Abstract

A method and apparatus for defining a random miss list and producing a desired hit ratio in a benchmark test of computer disk storage are disclosed. The disk area to be tested is divided into N tracks. A random miss list of L tracks is defined as specified by the invention. The tracks in the miss list are subdivided into groups, with each group having G tracks. Each one of a plurality of concurrent processes is assigned a different group of G tracks from the miss list. A pointer for each process is initialized to point to the first track in the corresponding group of G tracks. A plurality of input/output (I/O) operations are performed for each process, with each I/O operation being performed on the track pointed to by the pointer for the corresponding process. For each process, prior to each I/O operation that is performed after the first I/O operation, a random decision is made whether or not to increment the pointer belonging to the process. The probability of incrementing the pointer is equal to a desired miss ratio. By choosing the probability, the user can select any desired hit ratio. The addresses of the tracks in the miss list are more random, resulting in better, more reliable benchmark test results.


Find Patent Forward Citations

Cherian, Neena. (2001). Method and apparatus defining a miss list and producing dial-in hit ratios in a disk storage benchmark (U.S. Patent No. 6260113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6260113

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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