The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2001

Filed:

May. 21, 1999
Applicant:
Inventor:

Sung-Mok Kwag, Yongin, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 3/90 ;
U.S. Cl.
CPC ...
G11B 3/90 ;
Abstract

A defect detection circuit and method for detecting disk defects in an optical disc data reproduction system allows for correct detection of defects not only during operation in a constant linear velocity mode but also during operation in a constant angular velocity mode using a channel bit clock signal as a reference signal. The circuit includes a comparator for comparing an RF signal with a first compare voltage having a predetermined voltage level and a second compare voltage having a voltage level lower than the first compare voltage, and for generating a first comparison signal activated in response to the RF signal having a level higher than that of the first compare voltage and a second comparison signal activated in response to the RF signal having a voltage level lower than that of the second compare voltage. A defect detector receives the first and the second comparison signals and a channel bit clock signal, and generates a defect detecting signal when both the first and the second comparison signals are deactivated for a period of time less than nT in duration (here, n is a positive integer and T is a period of a channel bit clock signal) and when the first or the second comparison signal is deactivated for a period of time longer than the maximum pit length+mT where m is an integer larger than 0.


Find Patent Forward Citations

Kwag, Sung-Mok. (2001). Defect detection in an optical disk data reproduction system (U.S. Patent No. 6259664). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6259664

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