The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2001

Filed:

Apr. 23, 1999
Applicant:
Inventors:

Russel A. Martin, Menlo Park, CA (US);

Ken-Sue Tan, Saratoga, CA (US);

Assignee:

Silicon Image, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/36 ;
U.S. Cl.
CPC ...
G09G 5/36 ;
Abstract

An image or other multi-dimensional data set may have its sampling rate changed by determining weighting factors for the values of points in the original (input) data set used to calculate the value of a point in the new (output) data set. The weighting factors are determined using a function, such as a Gaussian function, that takes as input the relative location of the point in the new data set with respect to the locations of surrounding (neighboring) points in the original data set. The values of the points in the original data set are multiplied by the weighting factors, and the resultant products are added (or combined by another function) to give a value of the point in the new data set. In particular, when the input and output data sets are regularly spaced, such as with pixels for computer displays, the locations of the surrounding points and thus their weights repeat periodically. This results in increased efficiency because the surrounding points and their weights need to be determined only for a subset of the output data set.


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