The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2001

Filed:

Aug. 21, 1998
Applicant:
Inventors:

Arun Dalmia, Peabody, MA (US);

Conor O'Neill, Clonmel, IE;

Anthony W. Wilson, Stoneham, MA (US);

David M. Simmons, Peabody, MA (US);

Assignee:

Datacube, Inc., Danvers, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/186 ; G01N 2/188 ;
U.S. Cl.
CPC ...
G01N 2/186 ; G01N 2/188 ;
Abstract

A web inspection system for analysis of a moving web of material records and stores continuous sequences of the web. The web inspection system includes a camera for recording the continuous sequence of the web, an encoder for synchronizing movements of the web with the video image being recorded, and an Image Processing System (IPS) including a real time video disk for storing the image of the web and for displaying the continuous sequence web image on a video display. The IPS is also utilized for detecting faults or features and for categorizing the faults or features detected. The entire web is recorded and the image can be viewed either interactively while the image is being recorded or at a later time. The recorded image of the web can be played back at a slower speed to allow for a more detailed inspection of the web. The sequence image can be analyzed to build a defect image database. The web inspection system can also be utilized for sorting and displaying defect information.


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