The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2001

Filed:

Dec. 30, 1997
Applicant:
Inventors:

Yew Khoy Chuah, Taipei, TW;

Ming-Tsun Sun, Taoyuan, TW;

Bin-Juine Huang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/520 ; G01N 2/500 ; G01K 1/700 ; G01K 1/08 ;
U.S. Cl.
CPC ...
G01N 2/520 ; G01N 2/500 ; G01K 1/700 ; G01K 1/08 ;
Abstract

This invention makes use of a electronically controlled heating device to form a region of constant high temperature on one side of the insulating material, and causes most of the heat transfer to concentrate in a longitudinal heat flux, which flows across the direction of the thickness of object-to-be-tested, to achieve the effect of one-dimensional heat transfer. When the temperatures on both sides of the insulation material being tested come to a stable state, the temperatures, the thickness of the material, and the heat flux, are measured and used to calculate the heat conductivity. The difference between the ideal two-dimensional heat transfer and the one-dimensional heat transfer can be corrected by the results of a theoretical model. The apparatus has been used to test a material with known heat conductivity. The result of the test conforms well with the expected value. Currently, the prototype which has been developed may be designed with a digital circuit which consists mainly of a single-chip microcomputer to perform PWM (Pulse Width Modulation) temperature control, temperature measurement, parameter input and coefficient calculation and displays functions.


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