The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2001
Filed:
Nov. 22, 1999
Wei-Cheng Chu, Ilan, TW;
Yii Feng Huang, Tainan Hsien, TW;
Kun-Sheng Teng, Tainan, TW;
Yu-Fen Wang, Kaohsiung Hsien, TW;
Kang Na Hsiung Enterprise Co., Ltd., Tainan Hsien, TW;
Abstract
A method for determining an electrostatic force present in a flat object, includes: (a) positioning the object on a flat support; (b) providing a series of testing membranes which are substantially free of electrostatic charges and have different standarized weights; (c) placing on the surface of the object one of the testing membranes and turning the support to an inclined position relative to a horizontal plane; (d) repeating step (c) with the other ones of the testing membranes; (e) examining which one of the testing membranes slides relative to the object after the support is inclined, and determining the smallest weight among the standarized weights, that permits a sliding movement between the testing membranes and the object, and the largest weight among the standarized weights, that prevents the sliding movement; and (f) evaluating the electrostatic force as a function of the largest weight and the smallest weight. An apparatus for carrying out the process is also disclosed.