The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Mar. 31, 1999
Applicant:
Inventor:

Ching-Ming Lai, Wakefield, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract

In an improved computerized tomography scanner, the X-ray source is configured to have a focal spot that is variable in position in a direction parallel to or substantially parallel to the longitudinal or rotation axis of the scanner. Data are sampled from two different focal spot positions displaced in the longitudinal direction as the gantry rotates through successive projection angles, thereby providing two fan beams at different longitudinal positions. The data may be sampled at a detector array having a single or multiple rows. In this manner, at least two slices are scanned contemporaneously, and thus the scan throughput rate is at least doubled. The invention is further applicable to a system utilizing multiple detector rows.


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