The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2001
Filed:
Aug. 16, 1999
Applicant:
Inventor:
Ching-Ming Lai, Wakefield, MA (US);
Assignee:
Analogic Corporation, Peabody, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract
An apparatus and method for reconstructing image data for a region are described. A radiation source and an array of detectors located on opposed sides of a region are used to generate scan data for the region from a plurality of diverging radiation beams, i.e., a cone beam. The cone beam scan data for the region are converted into parallel beam scan data. The reordered parallel beam scan data are used to generate image data for a set of oblique image slices for the region, wherein the oblique image slices form a non-perpendicular angle with the longitudinal axis of the region.