The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Jul. 31, 1998
Applicant:
Inventors:

Peter C. Chen, Arlington, VA (US);

James S. Sirkis, Burtonsville, MD (US);

Assignee:

University of Maryland, College Park, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A fiber optic measurement system capable of greatly improving the cost, complexity, and efficiency with which flexible body shape estimates are made. The fiber optic shape measurement system uses Bragg grating sensor technology and time, spatial, and wavelength division multiplexing, to produce a plurality of strain measurements along one fiber path. Using a plurality of fibers, shape determination of the body and the tow cable can be made with minimal ambiguity. Also disclosed is a method to resolve the body shape based on strain-to-shape structural analysis. Possible applications include, but are not limited to, sensing the shape and position of flexible bodies, aid in improving the efficiency of existing acoustic surveying processing techniques, and related applications in geophysical prospecting.


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