The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2001

Filed:

Aug. 24, 1998
Applicant:
Inventors:

Richard B. Bylsma, Allentown, PA (US);

Gustav E. Derkits, Jr., New Providence, NJ (US);

William R. Heffner, Sinking Spring, PA (US);

Assignee:

Lucent Technologies, Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/714 ;
U.S. Cl.
CPC ...
H01L 2/714 ;
Abstract

The invention relates to semiconductor lasers and more particularly to structures which enable the semiconductor lasers to be tested for reliability. The invention further relates to methods for testing the reliability of semiconductor lasers in wafer or chip form. The invention also relates to methods for the fabrication of semiconductor lasers which includes the use of reliability tests in the fabrication process where the reliability tests includes measuring the voltage drop or drops across one or more levels of a laser structure during the passage of current through the structure.


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