The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2001
Filed:
Jun. 23, 1999
George Cragg, Somerville, MA (US);
Hyuk-Sang Kwon, Cambridge, MA (US);
Chen-Yuan Dong, Boston, MA (US);
Peter T. C. So, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
The invention features a microscopy system for imaging a sample including: a substantially transparent optical block having an interface for positioning the sample adjacent the interface; a light source which during operation overlaps at least two optical beams at the interface, the source directing the beams into the block towards the interface at incident angles that cause the beams to reflect from the interface and establish an evanescent standing wave of electromagnetic energy that extends away from the interface and into the sample; and a detector which during operation records an image of the sample based on optical radiation emitted from the sample in response to the evanescent standing wave. The invention also features a method for determining a high-resolution image of a sample including: coupling an evanescent standing wave of electromagnetic energy into the sample; recording an image of the sample based on radiation emitted from the sample in response to the evanescent standing wave for each of multiple positions of the standing wave; and constructing the high-resolution image based on the multiple recorded images.